Available Microscopic Capabilities
- Variety of Optical Light Microscopes
- SEM – Scanning Electron Microscopy
- TEM – Transmission Electron Microscopy
- EDS – Energy Dispersive X-Ray Spectroscopy
The characterization of surfaces requires a slightly different approach using a microscope that can measure surface roughness and provide a three-dimensional image of the surface. This microscope utilizes reflected white light while scanning through focus to create a three-dimensional data set from which surface roughness parameters can be calculated. Unlike stylus profilometry, SWLIM is a non-contact technique with little or no sample preparation required.